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Effect of supplemental O implantation on the radiation-induced hole traps in SIMOX buried oxides
Academic Article
Overview
Identity
Additional Document Info
Overview
Authors
Mary Zvanut
Published In
IEEE Transactions on Nuclear Science
Journal
Identity
Digital Object Identifier (doi)
10.1109/23.340577
Additional Document Info
Author List
Zvanut ME; Benefield C; Hughes HL
Start Page
2284
End Page
2290
Volume
41
Issue
6