Probabilistic evaluation of analog single event transients

Academic Article

Abstract

  • We propose a procedure to estimate the consequences of an analog single event transient (ASET). The method qualifies ASETs based on their frequency domain signatures and determines the probability of a single event transient induced error. © 2007 IEEE.
  • Authors

    Published In

    Digital Object Identifier (doi)

    Author List

  • Kauppila AV; Vaughn GL; Kauppila JS; Massengill LW
  • Start Page

  • 2131
  • End Page

  • 2136
  • Volume

  • 54
  • Issue

  • 6