Predicting visibility of interference fringes in X-ray grating interferometry

Academic Article

Abstract

  • The interference fringe visibility is a common figure of merit in designs of x-ray grating-based interferometers. Presently one has to resort to laborious computer simulations to predict fringe visibility values of interferometers with polychromatic x-ray sources. Expanding the authors' previous work on Fourier expansion of the intensity fringe pattern, in this work the authors developed a general quantitative theory to predict the intensity fringe pattern in closed-form formulas, which incorporates the effects of partial spatial coherence, spectral average and detector pixel re-binning. These formulas can be used to predict the fringe visibility of a Talbot-Lau interferometer with any geometry configuration and any source spectrum.
  • Authors

    Published In

  • Optics Express  Journal
  • Digital Object Identifier (doi)

    Author List

  • Yan A; Wu X; Liu H
  • Start Page

  • 15927
  • End Page

  • 15939
  • Volume

  • 24
  • Issue

  • 14