Design and analysis of a Schwarzschild imaging multilayer X-ray microscope

Academic Article

Abstract

  • Normal incidence multilayer x-ray mirror technology has now advanced to the point that high resolution x-ray microscopes with relatively large fields of view are feasible. High resolution aplanatic imaging x-ray microscopes configured from low x-ray scatter normal incidence multilayer optics should be ideal for laser fusion research, biological investigations, and astronomical studies when used in conjunction with grazing incidence or multilayer x-ray telescope systems. We have designed several Schwarzschild x-ray microscope optics. Diffraction analysis indicates that better than 600 angstrom spatial resolution in the object plane up to a 0.7 mm field of view can be achieved with 100 angstrom radiation. We are currently fabricating a 20 × normal incidence multilayer x-ray microscope of 1.35 m overall length. We have also analyzed and designed other microscope systems for use in conjunction with x-ray telescopes. This paper reports on the results of these studies and the x-ray microscope fabrication effort.
  • Authors

    Published In

    Digital Object Identifier (doi)

    Author List

  • Shealy DL; Hoover RB; Barbee TW; Walker ABC
  • Start Page

  • 721
  • End Page

  • 727
  • Volume

  • 29
  • Issue

  • 7