IonCCD detector for miniature sector-field mass spectrometer: Investigation of peak shape and detector surface artifacts induced by keV ion detection

Academic Article

Abstract

  • A recently described ion charge coupled device detector IonCCD (Sinha and Wadsworth, Rev. Sci. Instrum. 76(2), 2005; Hadjar, J. Am. Soc. Mass Spectrom. 22(4), 612-624, 2011) is implemented in a miniature mass spectrometer of sector-field instrument type and Mattauch-Herzog (MH)-geometry (Rev. Sci. Instrum. 62(11), 2618-2620, 1991; Burgoyne, Hieftje and Hites J. Am. Soc. Mass Spectrom. 8(4), 307-318, 1997; Nishiguchi, Eur. J. Mass Spectrom. 14(1), 7-15, 2008) for simultaneous ion detection. In this article, we present first experimental evidence for the signature of energy loss the detected ion experiences in the detector material. The two energy loss processes involved at keV ion kinetic energies are electronic and nuclear stopping. Nuclear stopping is related to surface modification and thus damage of the IonCCD detector material. By application of the surface characterization techniques atomic force microscopy (AFM) and X-ray photoelectrons spectroscopy (XPS), we could show that the detector performance remains unaffected by ion impact for the parameter range observed in this study. Secondary electron emission from the (detector) surface is a feature typically related to electronic stopping. We show experimentally that the properties of the MH-mass spectrometer used in the experiments, in combination with the IonCCD, are ideally suited for observation of these stopping related secondary electrons, which manifest in reproducible artifacts in the mass spectra. The magnitude of the artifacts is found to increase linearly as a function of detected ion velocity. The experimental findings are in agreement with detailed modeling of the ion trajectories in the mass spectrometer. By comparison of experiment and simulation, we show that a detector bias retarding the ions or an increase of the B-field of the IonCCD can efficiently suppress the artifact, which is necessary for quantitative mass spectrometry. ¬© American Society for Mass Spectrometry, 2011.
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    Author List

  • Hadjar O; Schlath√∂lter T; Davila S; Catledge SA; Kuhn K; Kassan S; Kibelka G; Cameron C; Verbeck GF
  • Start Page

  • 1872
  • End Page

  • 1884
  • Volume

  • 22
  • Issue

  • 10