Defect levels and types of point defects in high-purity and vanadium-doped semi-insulating 4H-SiC

Academic Article


  • Electron paramagnetic resonance (EPR) spectroscopy and photo-induced EPR are used to examine the point defects in vanadium-doped 4H-SiC and high-purity semi-insulating (HPSI) 4H-SiC grown by physical vapor transport. Both types of samples often exhibit a 1.1-eV activation energy, E a, as extracted from the temperature-dependent Hall/resistivity measurements; however, different defects are related to the same E a in each case. In the vanadium-doped wafers, the EPR data reveal both V 4+ and V 3+ in the same sample; thus, the 1.1-eV Hall activation energy is tentatively interpreted as the V 3+/4+ acceptor level. However, this conclusion cannot be confirmed because additional defects complicate the photoresponse of vanadium. The carbon vacancy, which is detected in all the HPSI wafers, exhibits a range of photothresholds similar to the various values measured for E a. The photo-EPR and temperature-dependent Hall/resistivity measurements made before and after a 1600°C anneal suggest that several different types of nonuniformly distributed defects participate in compensation of the HPSI material and that annealing selectively removes those with different defect levels. © 2004 American Institute of Physics.
  • Authors

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    Digital Object Identifier (doi)

    Author List

  • Zvanut ME; Konovalov VV; Wang H; Mitchel WC; Mitchell WD; Landis G
  • Start Page

  • 5484
  • End Page

  • 5489
  • Volume

  • 96
  • Issue

  • 10