A tensile stage to study thin polymer films in an environmental scanning electron microscope

Academic Article

Abstract

  • An economical and easily constructed tensile stage to study thin polymer films in an environmental scanning electron microscope has been developed. Surface features of the film and the morphology in the vicinity of a crack tip while under stress may be studied using this stage. The construction, sample mounting technique, and some of the photomicrographs obtained using this tensile stage have been illustrated and described. © 1998 American Institute of Physics.
  • Authors

    Published In

    Digital Object Identifier (doi)

    Author List

  • Thomas V; Wolfenden A
  • Start Page

  • 463
  • End Page

  • 465
  • Volume

  • 69
  • Issue

  • 1-2