Real-space imaging of current distributions at the submicron scale using magnetic force microscopy: Inversion methodology

Academic Article

Abstract

  • The technique for real-space imaging of current distributions at the submicron scale was described using magnetic force microscopy. The method was used to determine the current distribution in the vicinity of a (1×9) μm 2 slit-like defect embedded in a 11.5-μm-wide current-carrying metallic line. Current crowding and constriction were observed in the images and are resolved at the submicron level. It was found that the lateral resolution is noise limited to approximately one quarter of the tip height.
  • Published In

    Digital Object Identifier (doi)

    Author List

  • Rous PJ; Yongsunthon R; Stanishevsky A; Williams ED
  • Start Page

  • 2477
  • End Page

  • 2486
  • Volume

  • 95
  • Issue

  • 5