Mapping electron flow using magnetic force microscopy

Academic Article

Abstract

  • A method to image current distributions in metallic lines containing prototypical fabricated void defects, and correlate local changes in current density with differences in the defect geometry was demonstrated. It was shown that the technique could be extended to the 100 nm scale and was applicable for imaging of two-dimensional current distribution. It was found that magnetic force microscopy (MFM) resolved differences in the electron flow around defects of similar size but differing geometry.
  • Published In

    Digital Object Identifier (doi)

    Author List

  • Yongsunthon R; Stanishevsky A; Williams ED; Rous PJ
  • Start Page

  • 3287
  • End Page

  • 3289
  • Volume

  • 82
  • Issue

  • 19